The Labview Programming Environment for EMC Verification of RFID Systems

The aim of the article is to show practical possibilities of LabView application in an EPC/EMC/RFID laboratory. This paper presents advantages and disadvantages of LabView graphical development environment for controlling of test equipment in case of electromagnetic compatibility of RFID systems. As an example the applications for pulse/burst generator verification, radiated immunity test controlling and intermediate frequency analyzing for assessment of Radio Frequency Identification Technology used in logistics applications are shown.